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Structural analysis of cadmium sulfide thin film prepared by vacuum evaporation by using the FullProf program

A.M.Abdulwahab, SalahAbdul-Jabbar Jassim

Using the Fullprof program we analyzed X-ray diffraction of CdS thin film prepared by vacuum evaporation on glass substrate. The program fitted and refined the experimental XRD data by two methods; Le Bail fitting and Rietveld refinement. Experimental profiles of the XRD data were fitted by modified Thompson-Cox-Hastings pseudo-Voigt functions. The analyses revealed that CdS thin film has cubic (zinc blend) phase structure. A good agreement between experimental and simulated patterns was obtained. The values of lattice constant (a), space group, atomic coordinates (x, y, z), isotropic temperature factors (Biso), occupation (Occ.), multiplicity (m), bond length and bond angle between Cd and S atoms were calculated for CdS thin film. The FullProf program drew the structure in accordance with atomic positions for CdS thin film as three-dimensional projection which demonstrated that Cd and S atoms are formed in a tetrahedral configuration. The obtained data from the FullProf refinement were used to calculate the average crystallite size and related parameters for CdS thin film.